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Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure

dc.contributor.authorWAY, BMen_US
dc.contributor.authorDAHN, JRen_US
dc.contributor.authorTIEDJE, T.en_US
dc.contributor.authorMYRTLE, K.en_US
dc.contributor.authorKASRAI, M.en_US
dc.date.accessioned2013-06-19T15:08:00Z
dc.date.available2013-06-19T15:08:00Z
dc.date.issued1992-07en_US
dc.description.abstractNo abstract available.en_US
dc.identifier.citationWAY, BM, JR DAHN, T. TIEDJE, K. MYRTLE, et al. 1992. "Preparation and Characterization of Bxc1-X Thin-Films with the Graphite Structure." Physical Review B 46(3): 1697-1702. doi:10.1103/PhysRevB.46.1697en_US
dc.identifier.issn0163-1829en_US
dc.identifier.issue3en_US
dc.identifier.startpage1697en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.46.1697en_US
dc.identifier.urihttp://hdl.handle.net/10222/23265
dc.identifier.volume46en_US
dc.relation.ispartofPhysical Review Ben_US
dc.rights.holderCopyright 1992 The American Physical Society
dc.titlePreparation and Characterization of Bxc1-X Thin-Films with the Graphite Structureen_US
dc.typearticleen_US

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