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dc.contributor.authorTang, YHen_US
dc.contributor.authorZhang, P.en_US
dc.contributor.authorKim, PSen_US
dc.contributor.authorSham, TKen_US
dc.contributor.authorHu, YFen_US
dc.contributor.authorSun, XHen_US
dc.contributor.authorWong, NBen_US
dc.contributor.authorFung, MKen_US
dc.contributor.authorZheng, YFen_US
dc.contributor.authorLee, CSen_US
dc.contributor.authorLee, STen_US
dc.date.accessioned2013-08-12T16:55:58Z
dc.date.available2013-08-12T16:55:58Z
dc.date.issued2001-12en_US
dc.identifier.citationTang, YH, P. Zhang, PS Kim, TK Sham, et al. 2001. "Amorphous carbon nanowires investigated by near-edge-x-ray-absorption-fine-structures." Applied Physics Letters 79(23): 3773-3775.en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1425462en_US
dc.identifier.urihttp://hdl.handle.net/10222/30978
dc.description.abstractNo abstract available.en_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.titleAmorphous carbon nanowires investigated by near-edge-x-ray-absorption-fine-structuresen_US
dc.typearticleen_US
dc.identifier.volume79en_US
dc.identifier.issue23en_US
dc.identifier.startpage3773en_US
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