Browsing Obrovac, Mark N. by Author "Gao, Y."
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Explanation for the 4.8-V plateau LiCrxMn2-xO4
Obrovac, MN, Y. Gao, and JR Dahn. 1998. "Explanation for the 4.8-V plateau LiCrxMn2-xO4." Physical Review B 57(10): 5728-5733.Using the results of photoelectron spectroscopy (PES) measurements on LiCrxMn2-xO4 we provide an explanation for the origin of the 4.8-V plateau in Li/LiCrxMn2-xO4 cells. PES shows that the d bands derived from Mn 3d e(g) ... -
Use of carbon black to eliminate surface charging effects in photoelectron spectroscopy measurements of powders
Obrovac, MN, Y. Gao, MN Richard, and JR Dahn. 1997. "Use of carbon black to eliminate surface charging effects in photoelectron spectroscopy measurements of powders." Applied Physics Letters 71(16): 2262-2264.No abstract available.